Our Services

At the MWI Lab we provide RF material testing services from 1 MHz to 20 GHz using the PNAs (8720, 8364, 5230, N9923a) and LCR meters. The revolutionary equipment and technology we utilize allows for performing non-destructive RF material measurements over a wide range of frequencies using either the Gaussian Beam Antenna Technology or the Linearly Polarized Resonate Loop Technology.

Our primary devices use free space, Gaussian Beam Technology for performing non-destructive testing (NDT) and include, but are not limited to, insertion loss admittance tunnels, NRL reflection loss arches, reflectometer, surface defect imaging device and a new family of sensors called Electro-Magnetic Linear Polarized Resonate Sensors (E-pods).

Insertion Loss Admittance Tunnels

MWI_MAT24 Gaussian Beam Mini-Admittance tunnel

Specs:
- Frequency range 7-16 GHz or banded up to 50 GHz
- Internal dimensions 24”x24”x6”
- Beam size 2.5 inches in diameter
- Uses the MWI_PRAxx poly-rod antenna
- Incidence angle up to 70 degrees

Its single polarity can be adjusted for aligning the E-field for down-web or cross-web directions or for making off angle insertion loss measurement.

We now have this same device in a dual polarity configuration. The primary use of this system is to non-destructively measure small resistive loaded sheet and small composite materials parts when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 PNA. The XYZ Scanner and online versions will allow materials to pass between the probes.

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MWI_LAT48 Standard Gaussian Beam Admittance tunnel

Specs:
- Frequency range 0.7-18 GHz
- Internal dimensions 48”x48”x36”
- Beam size 12.5 inches in diameter
- Uses the Mr. Bean antenna
- Incidence angle up to 60 degrees

The beam’s size can be adjusted for aligning the E-field for horizontal or perpendicular directions, TE or TM for off angle measurements.
This chamber can be reconfigured to measure off-angle insertion from 0 to 60 degrees This system is used to non-destructively measure resistive loaded sheet and composite materials parts when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 PNA.

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Reflection Loss Arches

MWI_Arch24 Gaussian Beam Mini-reflection loss NRL arch

Specs:
- Frequency range 7-18 GHz or 10-20 GHz
- Test region dimensions 24”x24”x6”
- Beam size 2.5 inches in diameter
- Uses the MWI_PRAxx poly-rod antenna

Its single polarity that can be adjusted for aligning the E-field for TE and TM polarities.
We now have this same device in a dual polarity configuration. This system is primarily used to non-destructively measure small resistive loaded sheet and small composite materials parts without edge scattering when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 PNA. The XYZ Scanner and online versions will allow materials to pass near the reflection plane.

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MWI_Arch36 Standard Gaussian Beam NRL reflection loss arch
Specs:
- Frequency range 0.7-18 GHz
- Test region dimensions 60”x48”x36”
- Beam size 12.5 inches in diameter
- Uses the Mr. Bean antenna

This arch can be adjusted for aligning the E-field for TE or TM polarities. Each Antenna can be moved independently which permits an angle of reflection from +/-5 to +/- 80 degrees. The primary use of this system is to non-destructively measure resistive loaded sheet and composite materials parts when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 PNA.

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Uniformity Scanning/Defect Detection

MWI_Scanner-xxx
This scanner is a custom designed fully automated laboratory test system. It contains a MWI_Lxxx (E-pod) linear polarized eddy current sensor being used to determine a band separation within a honeycomb panel and measure uniformity at a VHF frequency. The antenna is a MWI_PRA24 Gaussian Beam poly-rod antenna being used to perform broad band uniformity measurements of the same honeycomb panel.

To achieve the best possible results we measure the sample by collecting S-parameters (dB & Phase), while moving the material via a virtual dielectric net instead of moving the antennas. The step size can be as small as 1mm resolution but we have found step sizes of 7MM or larger are more than enough for most uniformity testing. The table and motion dimensions can be adjusted to meet customer specifications. The largest table we have delivered is 8 ft x 14 ft test region and a physical size of 9 ft x 15 ft that collapses and extends to 16 ft x 28 ft. and carries a weigh of 12 lbs / sq-ft with less than ¼ inch deflection. The single polarity antennas can be adjusted for aligning the E-field for down-web or cross-web directions. It’s primarily used to measure the uniformity of resistive loaded sheet and composite materials when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 or N9923 PNA.

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MWI_ONLINE_Scanner-xxx
This test system uses MWI_Lxxx (E-pod) linear polarized Eddy current sensors mounted in a down-web and cross-web direction which can be mounted for six single polarities each having a separated position on the web.

This is a custom designed fully automated production QC test system. This system uses three N9923 PNA and one N5230 / 4 port PNA. The N5230 is connected to a pair of MWI_Mrbeanxxx antennas setup to perform insertion loss measurements. The Mr. Bean (freq. 0.7-18 GHz) can be easily replaced with two or four Poly-rod antennas (7-20 GHz) for measuring smaller test regions (>2.5in diam.) for multiple narrow banded sheet material. The single polarity antennas can be adjusted for aligning the E-field for down-web or cross-web directions. It’s primarily used to non-destructively measure resistive loaded sheet and composite materials when connected to a vector network analyzer such as the HP 8720es or 8364 / 5230 or N9923 PNA.

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